Electron Microscopy
Ìý
JEOL JSM-6340F Scanning Electron Microscope
This instrument is an ultra-high-resolution scanning electron microscope capable of secondary-electron image resolution of 1.2 nm. It is fully digital and incorporates an image archiving computer. This instrument is also equipped with an energy dispersive X-ray spectrometer (EDS), smart X-ray element mapping can be carried out. In the low-voltage mode it is capable of imaging a wide variety of uncoated insulating samples.
This instrument is an ultra-high-resolution scanning electron microscope capable of secondary-electron image resolution of 1.2 nm. It is fully digital and incorporates an image archiving computer. This instrument is also equipped with an energy dispersive X-ray spectrometer (EDS), smart X-ray element mapping can be carried out. In the low-voltage mode it is capable of imaging a wide variety of uncoated insulating samples.
- Resolution: 1.2nm
- Accelerating Voltage: 0.5-20keV
- Stage: X=50mm; Y=70mm, Z=25mm
- Tilt Angle: -5º to +45º
- Rotation: 360º Endless
- Energy Dispersive X-ray Spectrometer (EDS)
SEM Facility User Rates (Per Hour) | ||||||
Ìý | External Commercial (profit) | External Academic (non-profit) | Internal | |||
Ìý | Facility ÌýOperator | Self ÌýOperator | Facility ÌýOperator | Self Operator | Facility Operator | Self Operator |
SEM | $200 | $100 | $130 | $30 | $120 | $20 |
The microscope is located in Higgins 110. For all microscope questions and training, please contact:ÌýBret Judson.
Please note that all work performed in ÁùºÏ±¦µä core facilities and recharge centers should always be appropriately acknowledged.Ìý If you are publishing or presenting data acquired in ÁùºÏ±¦µä core facilities and recharge centers, please include the following statement in the Acknowledgement section of your manuscript/poster/presentation, "The authors would like to thank the Boston College <insert facility name> for assistance with the work presented in this paper/poster/presentation*."
* Delete as appropriate
JEOL 2010F Transmission Electron Microscope
This instrument is an advanced and digitally dedicated transmission electron microscope operating at 200kV with a field-emission gun. It is capable of an ultimate point-to-point resolution of 0.19 nm, with the ability to image lattice fringes at 0.14 nm resolution. It is a multipurpose ultrahigh resolution analytical electron microscope with a wide range of capabilities such as high-resolution image observation, nanoarea X-ray analysis, versatile analysis by convergent-beam electron diffraction, and analysis of the atomic structure and/or bonding state of atoms. With the addition of Energy dispersive X-ray spectrometer (EDS) and Parallel electron energy loss spectrometer (PEELS), the field-emission TEM can also be used as an elemental analysis tool, capable of identifying the elements in areas less than 2 nm in diameter.
- 200 kV, Schottky Field Emission Gun
- Ultra High Resolution Pole Piece (Cs=0.5 mm)
- 0.19 nm Point-to-Point Resolution
- Minimum Beam Size: 0.5 nm
- JEOL Single Tilt Low Background Holder
- JEOL Double Tilt Low Background Holder
- Double Tilt Heating Holder (Maximum Temperature: 1000ºC)
- Specimen Tilt Angle (X axis): ±20º
- High Resolution Imaging
- Convergent Beam Electron Diffraction (CBED)
- Energy Dispersive X-Ray Analysis (EDS)
- Electron Energy Loss Spectroscopy (EELS)
TEM Facility User Rates (Per Hour) | ||||||
Ìý | External Commercial (profit) | External Academic (non-profit) | Internal | |||
Ìý | Facility ÌýOperator | Self ÌýOperator | Facility ÌýOperator | Self Operator | Facility Operator | Self Operator |
TEM | $250 | $150 | $160 | $60 | $140 | $40 |
The microscope is located in Higgins 030. For all microscope questions and training, please contact:ÌýBret Judson.
Please note that all work performed in ÁùºÏ±¦µä core facilities and recharge centers should always be appropriately acknowledged.Ìý If you are publishing or presenting data acquired in ÁùºÏ±¦µä core facilities and recharge centers, please include the following statement in the Acknowledgement section of your manuscript/poster/presentation, "The authors would like to thank the Boston College <insert facility name> for assistance with the work presented in this paper/poster/presentation*."
* Delete as appropriate